Identification of Indicators for the Assessment of Technological Risks within Technology Selection

Schuh, Günther (Corresponding author); Scholz, Patrick (Corresponding author); Seichter, Stefan

Piscataway, NJ : IEEE (2020)
Buchbeitrag, Beitrag zu einem Tagungsband

In: 2020 61st International Scientific Conference on Information Technology and Management Science of Riga Technical University (ITMS) : proceedings : October 15-16, 2020, Riga, Latvia / edited by: Janis Grabis, Andrejs Romanovs, Galina Kulesova ; organized by: Riga Technical University, IEEE Latvia Section, Information Technology Institute of RTU ; publisher: IEEE
Seite(n)/Artikel-Nr.: 8 Seiten