Prototype for dual digital traceability of metrology data using X.509 and IOTA

Peterek, Martin Joachim (Corresponding author); Montavon, Benjamin Leendert

Paris : CIRP (2020)
Fachzeitschriftenartikel

In: CIRP annals, manufacturing technology
Band: 69
Heft: 1
Seite(n)/Artikel-Nr.: 449-452