Prototype for dual digital traceability of metrology data using X.509 and IOTA

Peterek, Martin Joachim (Corresponding author); Montavon, Benjamin Leendert

Paris / CIRP (2020) [Fachzeitschriftenartikel]

CIRP annals, manufacturing technology
Band: 69
Ausgabe: 1
Seite(n): 449-452