Artifact-free coordinate registration of heterogeneous Large-Scale Metrology systems

Pfeifer, Tilo; Montavon, Benjamin Leendert; Peterek, Martin Joachim (Corresponding author); Hughes, Ben

Paris : CIRP (2019)
Fachzeitschriftenartikel

In: CIRP annals, manufacturing technology
Band: 68
Heft: 1
Seite(n)/Artikel-Nr.: 503-506