Uncertainty-based test planning using dempster-shafer theory of evidence

Piscataway, NJ / IEEE (2017) [Contribution to a book, Contribution to a conference proceedings]

2017 2nd International Conference on System Reliability and Safety (ICSRS 2017) : December 20-22, 2017, Milan, Italy / IEEE ; conference general chair: Prof. Enrico Zio, Politecnico di Milano, Italy
Page(s): 243-249

Authors

Authors

Kukulies, Jan
Schmitt, Robert H.

Identifier