Material Analysis Lab

  Laboratory with experimental setup © WZL/Kaufmann

The Materials Analysis Lab acts as a service provider with a wide range of analytical methods for the investigation and optimization of manufacturing processes carried out at the WZL. The Materials Analysis Lab covers the area of metallography, scanning electron microscopy and residual stress investigations (XRD and borehole method). The focus in the investigation area is on surface and edge zone properties with respect to microstructure, heat-affected zones, hardening, microcracks, deformation and component-induced residual stresses. The materials investigated include steels, cast materials, nickel-based alloys and non-ferrous metals such as magnesium, titanium and aluminum alloys as well as hard metals and ceramics. Modern lightweight alloys from aerospace technology and materials produced by powder metallurgy can also be examined.

We use a variety of modern methods for the metallographic examination of the samples. In addition to stereo and light microscopes, a scanning electron microscope with a large sample chamber is available, which in many cases enables the non-destructive examination of tools and workpieces. In addition, it is possible to perform qualitative and quantitative material analyses with the scanning electron microscope using energy dispersive X-ray spectroscopy - EDX - and EBSD. Furthermore, it is possible to analyze components with regard to residual stresses. Both XRD and the borehole method are available here.

We offer corresponding investigations as a service. Due to the interdisciplinary approach between production engineering and materials analysis, the WZL has many years of experience in preparation and analysis. Experienced staff will advise you on the professional evaluation of the results.

Main topics

  • Microstructure characterization by light microscopy
  • Scanning electron microscopy with EDX/EBSD analysis
  • Microhardness measurement
  • Residual stress measurements (XRD/drill hole)
  • Optical Emission Spectroscopy (OES)